MINIMUM TEST SET FOR LOCALLY EXHAUSTIVE TESTING OF MULTIPLE-OUTPUT COMBINATIONAL-CIRCUITS

The locally exhaustive testing of multiple output combinational circui ts is the test which provides exhaustive test patterns for each set of inputs on which each output depends. First, this paper presents a suf ficient condition under which a minimum test set (MLTS) for the locall y exhaustive testing has 2w test patterns, where w is the maximum numb er of inputs on which any output depends. Next, we clarify that any CU T with up to four outputs satisfies the condition, independently of w and n, where n is the number of inputs of the CUT. Finally, we clarify that any CUT with five outputs also satisfies the condition for 1 les s-than-or-equal-to w less-than-or-equal-to 2 or n-2 less-than-or-equal -to w less-than-or-equal-to n.