Hc. Ko et al., FABRICATION AND OPTICAL-PROPERTIES OF ZNCDSE ZNSE SINGLE QUANTUM-WELLS ON GAAS(110) SURFACES CLEAVED IN UHV BY MOLECULAR-BEAM EPITAXY/, Semiconductor science and technology, 11(12), 1996, pp. 1873-1877
High-quality Zn0.85Cd0.15Se/ZnSe single quantum wells (SQWs) have been
fabricated on GaAs(110) crystal surfaces which were obtained by cleav
ing GaAs(100) wafers in ultra high vacuum (UHV). The growth interrupti
on was found to prevent the growth of high-quality quantum well struct
ures. The (110)-oriented SQWs grown under appropriate conditions show
a very sharp photoluminescence spectrum whose full width at half-maxim
um (FWHM) is as small as 4.9 meV. The sample showed a strong in-plane
polarization angle dependence of the emission intensity, due to the co
mpressive strain in the well layer. The ratio of maximum to minimum va
lues of the polarized PL intensity was 1.6.