MICRO-RAMAN SPECTROSCOPY OF SOL GEL-DERIVED PB(ZRXTI1-X)O3 THIN-FILMS

Thin films of ferroelectric PbZrxTi1-xO3 were prepared by the sol-gel technique on sapphire and fused-quartz substrates with thicknesses ran ging from 0.6 to 1.2 mum. Powders of the above substance were also pre pared by hydrolysis and condensation of the same precursor sol and cry stallized by holding them at 600-degrees-C for either 6 or 12 h. From a comparison of the Raman spectra it is obvious that both powders and the film on sapphire substrate belong to the perovskite structure, whe reas the film on fused quartz has a phyrochlore structure. These obser vations agree well with x-ray measurements of diffraction patterns. Ab sence of 70 cm-1 E(TO) band in the film suggests that the film is rhom bohedral with x being well above 0.535.