DESIGN OF A NEW HIGH-TEMPERATURE DIELECTROMETER SYSTEM

Important engineering design criteria and measurement constraints of a high-speed, automatic, high-temperature dielectrometer including a co axial re-entrant cavity with a hollow center conductor are described. By virtue of selective and localized microwave heating, a part of a sm all sample can be rapidly heated to its melting point while keeping th e test chamber at room temperature. Significant high-temperature diele ctric measurement problems are there by minimized for the 915 and 2450 MHz ISM bands. This system can acquire dielectric data of a ceramic m aterial from room temperature to 1500-degrees-C in less than one minut e.