W. Tinga et W. Xi, DESIGN OF A NEW HIGH-TEMPERATURE DIELECTROMETER SYSTEM, The Journal of microwave power and electromagnetic energy, 28(2), 1993, pp. 93-103
Important engineering design criteria and measurement constraints of a
high-speed, automatic, high-temperature dielectrometer including a co
axial re-entrant cavity with a hollow center conductor are described.
By virtue of selective and localized microwave heating, a part of a sm
all sample can be rapidly heated to its melting point while keeping th
e test chamber at room temperature. Significant high-temperature diele
ctric measurement problems are there by minimized for the 915 and 2450
MHz ISM bands. This system can acquire dielectric data of a ceramic m
aterial from room temperature to 1500-degrees-C in less than one minut
e.