ERROR ANALYSIS AND PERMITTIVITY MEASUREMENTS WITH REENTRANT HIGH-TEMPERATURE DIELECTROMETER

Authors
Citation
W. Xi et W. Tinga, ERROR ANALYSIS AND PERMITTIVITY MEASUREMENTS WITH REENTRANT HIGH-TEMPERATURE DIELECTROMETER, The Journal of microwave power and electromagnetic energy, 28(2), 1993, pp. 104-112
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
08327823
Volume
28
Issue
2
Year of publication
1993
Pages
104 - 112
Database
ISI
SICI code
0832-7823(1993)28:2<104:EAAPMW>2.0.ZU;2-D
Abstract
A comprehensive error analysis of a high temperature dielectrometer sy stem is given. Pertinent measurement techniques, especially those affe cting the measurement accuracy, are described. Experimental results of dielectric measurements from room temperature to 1500-degrees-C on a selection of ceramics are presented.