Using medium-energy ion-scattering (MEIS) as an in situ probe of cover
age, we have investigated the adsorption of Cu on SiO2 and MgO(001) su
rfaces at 300 K. For the clean surfaces, only 35% (Cu/SiO2) and 50% (C
u/MgO) of the initially incident Cu atoms stick to the surfaces and ar
e detected by MEIS. Our results are discussed in terms of a model in w
hich desorption competes with migration and sticking of Cu adatoms ont
o defects and growing Cu nuclei.