The formation of Sm silicides on Si(111) by means of solid phase epita
xy has been studied with low energy electron diffraction, Auger electr
on spectroscopy and photoelectron spectroscopy of the Sm 4f level and
Si 2p level. A limited reaction is found to occur already at room temp
erature whereas at higher temperatures a strongly intermixed Sm/Si lay
er showing some long range order is formed. The Sm atoms of this inter
mixed phase are found to be completely trivalent in accordance with ex
pectations. The intermixed layer consists of two silicides with differ
ent compositions, one of them being SmSi2-x, the other being tentative
ly ascribed to SmSi.