PASSIVE FILM COMPOSITION AND PITTING BEHAVIOR OF FE-25CR-11NB STUDIEDBY SCANNING AUGER MICROSCOPY

Authors
HUBSCHMID C MATHIEU HJ LANDOLT D
Citation
C. Hubschmid et al., PASSIVE FILM COMPOSITION AND PITTING BEHAVIOR OF FE-25CR-11NB STUDIEDBY SCANNING AUGER MICROSCOPY, Surface and interface analysis, 20(9), 1993, pp. 755-760
Citations number
21
Categorie Soggetti
Chemistry Physical
Journal title
Surface and interface analysis → ACNP
ISSN journal
01422421
Volume
20
Issue
9
Year of publication
1993
Pages
755 - 760
Database
ISI
SICI code
0142-2421(1993)20:9<755:PFCAPB>2.0.ZU;2-#
Abstract
Scanning Auger microscopy has been applied to the characterization of passive films formed on an Fe-25Cr-11 Nb model alloy having a dendriti c structure. The composition of the passive film is spatially non-unif orm and reflects the phase structure of the alloy. The Fe-25Cr-11Nb al loy exhibited a better resistance to pitting than a binary Fe-25Cr all oy. This is due to the fact that, on one hand, niobium improves the pi tting resistance of the niobium-rich phase while, on the other hand, t he pitting resistance of the niobium-poor phase is enhanced by chromiu m segregation.