DEFECTS IN PHOTOREFRACTIVE CDTEV - AN ELECTRON-PARAMAGNETIC-RESONANCESTUDY

Citation
Hj. Vonbardeleben et al., DEFECTS IN PHOTOREFRACTIVE CDTEV - AN ELECTRON-PARAMAGNETIC-RESONANCESTUDY, Applied physics letters, 63(8), 1993, pp. 1140-1142
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
63
Issue
8
Year of publication
1993
Pages
1140 - 1142
Database
ISI
SICI code
0003-6951(1993)63:8<1140:DIPC-A>2.0.ZU;2-O
Abstract
Vanadium-doped CdTe has recently been shown to have a high sensitivity for optical processing at 1.5 mum but the role of the vanadium dopant has been questioned- We present the results of an electron paramagnet ic resonance study of this material, which demonstrates that vanadium is the dominant paramagnetic defect, which pins the Fermi level and gi ves rise to photoconductivity at 1.5 mum. The vanadium is substitution ally incorporated on a Cd site at concentrations of almost-equal-to 5 X 10(16) cm-3 and acts as a deep donor with a 2+/3+ level at E(v)+0.8 eV. The defect is only observed in the 3+ charge state. The spin Hamil tonian parameters of the V3+ defect are determined as follows: electro n spin S=1, Lande g-factor g=1.962+/-0.001, central hyperfine interact ion constant A=60X10(-4) cm-1, Cd Ligand hyperfine interaction constan t T=4X10(-4) cm-1.