Ts. Moise et al., ROOM-TEMPERATURE OPERATION OF A RESONANT-TUNNELING HOT-ELECTRON TRANSISTOR BASED INTEGRATED-CIRCUIT, IEEE electron device letters, 14(9), 1993, pp. 441-443
We demonstrate the first resonant-tunneling hot-electron transistor (R
HET) EXCLUSIVE-NOR integrated circuit that operates at room temperatur
e. The XNOR circuit, consisting of a single resonant-tunneling transis
tor and four thin-film resistors, exhibits a 500-mV output voltage swi
ng between the high- and low-logic levels when biased with a 1.8-V sup
ply. The transistor, which features a novel InGaP collector barrier, h
as a peak current density of 4 X 10(4) angstrom . cm-2, a common-base
transfer coefficient of 0.9, and a peak-to-valley current ratio of 10:
1 when operated in a common-emitter mode.