F. Garrido et al., NEW INSIGHT ON THE ION-BEAM-INDUCED PLASTIC-DEFORMATION IN AMORPHOUS-ALLOYS BY MARKER EXPERIMENTS, Radiation effects and defects in solids, 126(1-4), 1993, pp. 129-132
The macroscopic atomic transport induced in amorphous systems by ion e
lectronic energy loss is studied by means of RBS experiments on a mark
er either implanted (Bi) or evaporated (Au) in the target. Irradiation
of amorphous Ni3B with 500 MeV I ions leads to (i) a huge shift of th
e marker profile towards the sample surface, (ii) a surprising decreas
e of its distribution width. The results are totally accounted for by
the plastic deformation phenomenon induced by electronic excitation in
amorphous materials.