SCANNING FORCE MICROSCOPY OF HEAVY-ION TRACKS

Authors
ACKERMANN J GRAFSTROM S NEITZERT M NEUMANN R TRAUTMANN C VETTER J ANGERT N
Citation
J. Ackermann et al., SCANNING FORCE MICROSCOPY OF HEAVY-ION TRACKS, Radiation effects and defects in solids, 126(1-4), 1993, pp. 213-216
Citations number
18
Categorie Soggetti
Physics, Condensed Matter","Nuclear Sciences & Tecnology
Journal title
Radiation effects and defects in solids → ACNP
ISSN journal
10420150
Volume
126
Issue
1-4
Year of publication
1993
Pages
213 - 216
Database
ISI
SICI code
1042-0150(1993)126:1-4<213:SFMOHT>2.0.ZU;2-2
Abstract
Polycarbonate, polyimide, and glass samples were irradiated with heavy ions in the 11.4-14.0 MeV/amu energy range at the UNILAC of GSI. Afte r etching and partly coating the specimens with a thin gold layer, ion tracks were studied with scanning force microscopy, including imaging in the lateral-force mode. Results on pore features such as the radiu s as a function of etching time are presented.