D. Zymierska et J. Auleytner, THEORETICAL INVESTIGATION OF DEFECTS INDUCED IN SILICON-CRYSTALS BY HIGH-ENERGY HEAVY-IONS, Radiation effects and defects in solids, 126(1-4), 1993, pp. 279-282
The aim of the present paper was an attempt at explanation of origin o
f X-ray diffraction images of extended defects arising from irradiatio
n of silicon single crystals by high-energy krypton ions.