THE ELECTRICAL-RESISTANCE OF GADOLINIUM FILMS

Citation
Mj. Zhang et al., THE ELECTRICAL-RESISTANCE OF GADOLINIUM FILMS, Journal of physics and chemistry of solids, 54(8), 1993, pp. 947-950
Citations number
15
Categorie Soggetti
Physics, Condensed Matter",Chemistry
ISSN journal
00223697
Volume
54
Issue
8
Year of publication
1993
Pages
947 - 950
Database
ISI
SICI code
0022-3697(1993)54:8<947:TEOGF>2.0.ZU;2-3
Abstract
We report the investigation of the electrical resistance of thin gadol inium films deposited onto Coming glass (7059) substrates at room temp erature. During the deposition, the pressure reached about 3 x 10(-9) torr with a deposition rate of 10 angstrom s-1. The mechanisms of the conduction in gadolinium film have been identified. In the percolation region, 28 angstrom less-than-or-equal-to d less-than-or-equal-to 58 angstrom, the conductivity of the film is well described by (d - d(c)) t, where t = 1.27 +/- 0.01, and d(c) = (23.0 +/- 0.1) angstrom are in very good agreement with the two-dimensional percolation theory.