DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS

Authors
ANSELMETTI D GERBER C MICHEL B WOLF H GUNTHERODT HJ ROHRER H
Citation
D. Anselmetti et al., DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS, Europhysics letters, 23(6), 1993, pp. 421-426
Citations number
21
Categorie Soggetti
Physics
Journal title
Europhysics letters → ACNP
ISSN journal
02955075
Volume
23
Issue
6
Year of publication
1993
Pages
421 - 426
Database
ISI
SICI code
0295-5075(1993)23:6<421:DTFCSF>2.0.ZU;2-V
Abstract
We show that by measuring force and stiffness on a constant-current sc anning tunnelling microscopy (STM) contour a deformation-free topograp hy can be extracted. With reference to mono- and bicomponent self-asse mbled monolayers, we find that the characteristic depression pattern a nd the protrusions on a multicomponent film found in STM are to a grea t extent due to electronic effects.