VOLTAMPEROMETRIC AND FLOTATION-PHOTOMETRIC DETERMINATION OF TRACES OFSILICON IN HIGH-PURITY COPPER

Authors
GURENTSOVA OI PROKHOROVA GV OSIPOVA EA DOROKHOVA EN
Citation
Oi. Gurentsova et al., VOLTAMPEROMETRIC AND FLOTATION-PHOTOMETRIC DETERMINATION OF TRACES OFSILICON IN HIGH-PURITY COPPER, Journal of analytical chemistry, 48(2), 1993, pp. 238-241
Citations number
5
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of analytical chemistry → ACNP
ISSN journal
10619348
Volume
48
Issue
2
Year of publication
1993
Part
2
Pages
238 - 241
Database
ISI
SICI code
1061-9348(1993)48:2<238:VAFDOT>2.0.ZU;2-P