TESTING ADCS AT SAMPLE RATES FROM 20 TO 120 MSPS

Authors
CRAWLEY HB MCKAY R MEYER WT ROSENBERG EI THOMAS WD
Citation
Hb. Crawley et al., TESTING ADCS AT SAMPLE RATES FROM 20 TO 120 MSPS, IEEE transactions on nuclear science, 40(4), 1993, pp. 729-732
Citations number
5
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
40
Issue
4
Year of publication
1993
Part
1
Pages
729 - 732
Database
ISI
SICI code
0018-9499(1993)40:4<729:TAASRF>2.0.ZU;2-Y
Abstract
We present results from an on-going program to test the performance of high speed analog to digital converters suitable for use at the. SSC and LHC colliders. For each device we have measured a large number of parameters such as number of effective bits, noise level, aperture jit ter, nonlinearity, analog bandwidth, and total harmonic distortion. In this report, present results from a variety of eight- and ten-bit dev ices. We will continue this work, extending it to twelve-bit devices a s they become available.