We have conducted a laboratory study of HgI2 spectrometers used for in
-situ determination of lead on painted surfaces. Cd-109 and Co-57 isot
opes have been used to excite lead characteristic x-rays from samples.
The energy resolution of HgI2 detectors in the energy region correspo
nding to lead K x-rays has been measured. An energy resolution of 880
eV (FWHM) for the 60 keV line from an Am-241 source has been obtained.
Measurements using thin film standards ranging from 0.5 mg Pb/cm2 to
2 mg Pb/cm2 have been conducted. Detection limits, accuracy and precis
ion of the measurements have been estimated. Based upon a comparison o
f the results that we have obtained with the performance of existing d
etector technology, the HgI2 detectors seem to be the best solution fo
r handheld XRF lead analyzers.