A planar multi target sputtering approach was used to deposit self pol
arized PZT films on TiO2/Pt bottom electrodes for the use in thin film
pyroelectric IR detector arrays. By using elevated substrate temperat
ures of about 450 degrees C ''in situ'' growth of tetragonal PZT could
be achieved. The films exhibited pyroelectric currents without poling
. The pyroelectric coefficient was 2 x 10(-4) C/m(2)K, the dielectric
constant was 300 and dielectric loss tan delta was 0.01. The self pola
rization disappears after heating the sample to 600 degrees C. Stresse
s were studied in the thin film processing for the bottom electrode an
d the PZT film. The TiO2/Pt electrode is under high tensile stress of
900 MPa after preparation. PZT has a small compressive stress of -60 M
Pa, the whole TiO2/Pt/PZT stack has a tensile stress of +80 MPa. This
low stress level together with the self polarization and the good elec
trical properties makes the films suitable for the use in pyroelectric
detector arrays.