DIRECT IMAGING OF SURFACE CUSP EVOLUTION DURING STRAINED-LAYER EPITAXY AND IMPLICATIONS FOR STRAIN RELAXATION

Citation
De. Jesson et al., DIRECT IMAGING OF SURFACE CUSP EVOLUTION DURING STRAINED-LAYER EPITAXY AND IMPLICATIONS FOR STRAIN RELAXATION, Physical review letters, 71(11), 1993, pp. 1744-1747
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
71
Issue
11
Year of publication
1993
Pages
1744 - 1747
Database
ISI
SICI code
0031-9007(1993)71:11<1744:DIOSCE>2.0.ZU;2-T
Abstract
We have directly imaged the evolution of surface cusps during strained -layer epitaxy. The cusps arise naturally as a result of gradients in the surface chemical potential. High stress concentrations at the cusp tip have important implications for strain relaxation in the film via dislocation nucleation.