STRUCTURE AND ELECTRONIC-PROPERTIES OF POLYTHIOPHENE AND POLY(3-ALKYLTHIOPHENE) FILMS ELECTROPOLYMERIZED ON INDIUM TIN OXIDE (ITO) GLASS ATELEVATED POTENTIALS
J. Mardalen et al., STRUCTURE AND ELECTRONIC-PROPERTIES OF POLYTHIOPHENE AND POLY(3-ALKYLTHIOPHENE) FILMS ELECTROPOLYMERIZED ON INDIUM TIN OXIDE (ITO) GLASS ATELEVATED POTENTIALS, Die Makromolekulare Chemie, 194(9), 1993, pp. 2483-2495
Homogeneous and flexible films of polythiophene are known to be diffic
ult to obtain electrochemically on indium tin oxide (ITO) glass electr
odes using normal 1,6-1,7 V applied voltage. The situation is greatly
improved by using higher voltage. 0,1 - 10 mum thick films of polythio
phene (PT) and various poly(3-alkylthiophene)s (P3AT's) (alkyl = methy
l (P3MT), hexyl (P3HT) and octyl (P3OT)) were electropolymerized on IT
O-covered glass anodes under an applied voltage of 8 V vs. an Ag/AgCl
reference eletrode. In this paper we report upon the properties of the
se films compared to their chemically and at low-voltage electrochemic
ally polymerized equivalents. Generally, the films have all the proper
ties known for PT and P3AT's. Characteristics such as thermo- and solv
atochromism, conductivity and electronic band structure as studied by
ultraviolet photoemission spectroscopy and optical absorption were com
parable to the properties shown by the reference samples. However, the
structure of high-voltage films differs considerably from those repor
ted for chemically polymerized samples. The high-voltage films contain
a higher amorphous fraction, and the polymer is more cross-linked and
branched.