DEFORMATION DETERMINATION IN EPITAXIAL-FI LMS BY THE DIFFRACTION CURVE REFLECTION TECHNIQUE

Authors
CHUKHOVSKII FN LIDER VV
Citation
Fn. Chukhovskii et Vv. Lider, DEFORMATION DETERMINATION IN EPITAXIAL-FI LMS BY THE DIFFRACTION CURVE REFLECTION TECHNIQUE, Kristallografia, 38(4), 1993, pp. 259-261
Citations number
2
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
38
Issue
4
Year of publication
1993
Pages
259 - 261
Database
ISI
SICI code
0023-4761(1993)38:4<259:DDIELB>2.0.ZU;2-G