STUDY OF GAAS ION-ALLOYED LAYERS WITH (10 0) AND (211) ORIENTATIONS BY THE 2-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD

Authors
LOMOV AA SIROCHENKO VP IMAMOV RM
Citation
Aa. Lomov et al., STUDY OF GAAS ION-ALLOYED LAYERS WITH (10 0) AND (211) ORIENTATIONS BY THE 2-CRYSTAL X-RAY-DIFFRACTOMETRY METHOD, Kristallografia, 38(4), 1993, pp. 272-274
Citations number
9
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
38
Issue
4
Year of publication
1993
Pages
272 - 274
Database
ISI
SICI code
0023-4761(1993)38:4<272:SOGILW>2.0.ZU;2-7