The results of an experimental study of samples of MnxHg1-xTe films gr
own by liquid-phase epitaxy on a Cd0.96Zn0.04Te substrate are presente
d. It shows that, as a result of the diffusion of cadmium from the sub
strate, a CdxMnyHg1-x-yTe film with a variable band-gap layer is forme
d close to the (epitaxial-film)-substrate interface. The appearance of
this variable band gap is revealed by the transport phenomena. The te
mperature dependence of the band gap E(g)(T) is determined in a linear
approximation on T from the results of a theoretical analysis of the
temperature dependences of the free-carrier concentration and mobility
. It is shown that averaging the semiempirical dependences for the ter
nary compounds with the extreme compositions, using the virtual-crysta
l approximation, can produce large errors when determining E(g)(T) in
a specific semiconductor. (C) 1997 American Institute of Physics.