DEVELOPMENT OF AN ANGLE-RESOLVING ELECTRON SPECTROMETER

An angle-resolving electron spectrometer has been developed for use wi th an ultra high vacuum scanning electron microscope. A large cylindri cal mirror analyser has been equipped with a parallel detection system for simultaneous recording of electron energy spectra and angle-resol ved images. Two different models have been developed to simulate the s pectrometer. Angle-resolved images and energy spectra of different ele ctron emission functions can be simulated. The angle-resolved images f rom amorphous samples were used to check the two simulation models and the performance of the spectrometer. Some initial results of applying the spectrometer on Ag/Ge(111) and Ag/alpha-Ge are discussed.