IMPROVEMENTS IN RESISTANCE SCALING AT NIST USING CRYOGENIC CURRENT COMPARTORS

Citation
Rf. Dziuba et Re. Elmquist, IMPROVEMENTS IN RESISTANCE SCALING AT NIST USING CRYOGENIC CURRENT COMPARTORS, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 126-130
Citations number
14
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
42
Issue
2
Year of publication
1993
Pages
126 - 130
Database
ISI
SICI code
0018-9456(1993)42:2<126:IIRSAN>2.0.ZU;2-L
Abstract
Cryogenic current comparators (CCC's) are being used at NIST to verify Hamon-type resistance scaling techniques from 1 to 100 OMEGA, 1 kOMEG A, 6453.20 OMEGA, and 10 kOMEGA. Measurements comparing the 10/1, 64.5 32/1, and 100/1 ratios of CCC's to that of Hamon transfer ratios agree to = 0.01 ppm, the practical limit of accuracy using Hamon transfer s tandards with conventional resistance bridges. The higher ratio accura cies and sensitivities of CCC bridges will make it possible to lower t he uncertainties associated with resistance scaling at NIST significan tly.