TRACING THE COMPLEX RF REFLECTION COEFFICIENT IN THE MHZ RANGE BACK TO DC RESISTANCE STANDARDS BY UTILIZING PLANAR NICR THIN-FILM RESISTORS

Authors
STUMPER U GRNO L JANIK D PEINELT W WEIMANN T
Citation
U. Stumper et al., TRACING THE COMPLEX RF REFLECTION COEFFICIENT IN THE MHZ RANGE BACK TO DC RESISTANCE STANDARDS BY UTILIZING PLANAR NICR THIN-FILM RESISTORS, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 351-355
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
Journal title
IEEE transactions on instrumentation and measurement → ACNP
ISSN journal
00189456
Volume
42
Issue
2
Year of publication
1993
Pages
351 - 355
Database
ISI
SICI code
0018-9456(1993)42:2<351:TTCRRC>2.0.ZU;2-5
Abstract
A method to determine the three error box parameters of complex reflec tometers is proposed where a number of planar NiCr thin-film resistors mounted in identical coaxial connectors and traced back to dc resista nce standards is used. First experimental results show that this metho d seems to be applicable to frequencies up to about 500 MHz.