ULTRA-STABLE SAPPHIRE RESONATOR-OSCILLATOR

Citation
An. Luiten et al., ULTRA-STABLE SAPPHIRE RESONATOR-OSCILLATOR, IEEE transactions on instrumentation and measurement, 42(2), 1993, pp. 439-443
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic","Instument & Instrumentation
ISSN journal
00189456
Volume
42
Issue
2
Year of publication
1993
Pages
439 - 443
Database
ISI
SICI code
0018-9456(1993)42:2<439:USR>2.0.ZU;2-3
Abstract
This paper reports preliminary measurements on the properties of cryog enic sapphire resonators with various concentrations of paramagnetic i mpurities. These resonators have been mounted in both copper and niobi um shields. We have found that we can achieve extrema in the frequency -temperature function in the temperature range 5-18 K due to the compe nsating effects of the dielectric constant temperature dependence and the Curie law dependence of the susceptibility of the paramagnetic imp urities. In sapphire samples with dominant impurities Cr3+ and Fe3+, w e find strong influences on the mode frequency when we are near the el ectron spin resonances (ESR) at 11.45 GHz and 12.04 GHz, respectively, and no extrema occurs when we are above the ESR frequency. In samples where dominant paramagnetic impurity has a high ESR we get an essenti ally frequency independent frequency-temperature compensation. In thes e samples we have observed unloaded resonator Q factors as high as 4 x 10(9). The increased Q factors coupled with reduced shield interactio ns should result in an improvement in frequency stability for an oscil lator based around this resonator as compared to the best results achi eved to date at this laboratory (an Allan Variance of 9 x 10(-15)). We report the preliminary measurement of the tilt sensitivity of our osc illator to be a fractional frequency shift of 6.5 x 10(-12) per degree .