VELOCITY MODULATION IN FOCUSED-ION-BEAM WRITTEN IN-PLANE-GATE TRANSISTORS

Citation
T. Bever et al., VELOCITY MODULATION IN FOCUSED-ION-BEAM WRITTEN IN-PLANE-GATE TRANSISTORS, Applied physics letters, 63(5), 1993, pp. 642-644
Citations number
5
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
63
Issue
5
Year of publication
1993
Pages
642 - 644
Database
ISI
SICI code
0003-6951(1993)63:5<642:VMIFWI>2.0.ZU;2-8
Abstract
The mobility of a one-dimensional electron gas can be changed markedly by moving the electron path from the high-mobility channel toward the low-mobility focused ion-beam-implanted regions. This can be done sim ply by applying different biases to the two adjacent in-plane gates. W hen the bias voltage on one gate is fixed, we increase the other gate potential and force the current path close to the ion-implanted region . In this way the mobility rather than the density of the carriers is controlled, which is the key feature of the velocity modulation transi stors with inherently fast response.