ATOMIC-FORCE MICROSCOPY USED FOR THE CHARACTERIZATION OF PRECIPITATEDCOLLOIDAL PARTICLES

Citation
Ud. Schwarz et al., ATOMIC-FORCE MICROSCOPY USED FOR THE CHARACTERIZATION OF PRECIPITATEDCOLLOIDAL PARTICLES, Helvetica Physica Acta, 66(4), 1993, pp. 413-414
Citations number
6
Categorie Soggetti
Physics
Journal title
ISSN journal
00180238
Volume
66
Issue
4
Year of publication
1993
Pages
413 - 414
Database
ISI
SICI code
0018-0238(1993)66:4<413:AMUFTC>2.0.ZU;2-H
Abstract
Colloidal particles play an important role in advanced materials scien ce since their size, shape and structure can be controlled and influen ced in a wide range. These parameters can be determined by atomic forc e microscopy. In this work, photographic AgBr microcrystals as well as amorphous nanoceramics consisting of TiO2, FeYO3 or Fe2O3 particles w ere studied and characterized on different imaging scales. Surface fin e structures on the silver halide microcrystals as well as the amorpho us-crystalline transition of the oxide particles will be discussed.