OPTOELECTRONIC MODULATION SPECTROSCOPY (OEMS) - A NEW TOOL FOR DEVICEINVESTIGATIONS

Authors
DIMARCO M WANG QH SWANSON JG
Citation
M. Dimarco et al., OPTOELECTRONIC MODULATION SPECTROSCOPY (OEMS) - A NEW TOOL FOR DEVICEINVESTIGATIONS, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 225-231
Citations number
7
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
20
Issue
1-2
Year of publication
1993
Pages
225 - 231
Database
ISI
SICI code
0921-5107(1993)20:1-2<225:OMS(-A>2.0.ZU;2-N
Abstract
The principle of optoelectronic modulation spectroscopy (OEMS) is expl ained. Examples of its use in three different measurement modes are de scribed and it is shown that the energy locations of mid-gap bulk and interface states can be ascertained when the sub-band-gap admittance a nd depletion modes are used together; the band with easiest electrical communication is also revealed for each state. Using super-band-gap r adiation allows spectral features associated with resonant electron st ates to be observed directly without the need to distort the band stru cture.