EXTREMELY LOW-BACK FACET FEEDBACK BY QUANTUM-CONFINED STARK-EFFECT ABSORPTION IN AN EDGE-EMITTING LIGHT-EMITTING DIODE

Authors
FOUQUET JE SORIN WV TROTT GR LUDOWISE MJ BRAUN DM
Citation
Je. Fouquet et al., EXTREMELY LOW-BACK FACET FEEDBACK BY QUANTUM-CONFINED STARK-EFFECT ABSORPTION IN AN EDGE-EMITTING LIGHT-EMITTING DIODE, IEEE photonics technology letters, 5(5), 1993, pp. 509-511
Citations number
6
Categorie Soggetti
Optics,"Physics, Applied
Journal title
IEEE photonics technology letters → ACNP
ISSN journal
10411135
Volume
5
Issue
5
Year of publication
1993
Pages
509 - 511
Database
ISI
SICI code
1041-1135(1993)5:5<509:ELFFBQ>2.0.ZU;2-X
Abstract
The quantum-confined Stark effect is employed to form an integral reve rse-biased absorber in a GaInAsP edge-emitting light emitting diode. O ptical low coherence reflectometry is used to measure the magnitude of reflections through this absorber. Front facet-back facet roundtrip r eflection magnitudes are below -110 dB in devices having an antireflec tion coating on the front facet only. All other round trip reflections are below -80 dB. This device provides a wide usable dynamic range in optical low coherence reflectometry measurements.