STABILIZED CUBIC ZIRCONIA - A RAMAN-STUDY UNDER UNIAXIAL-STRESS

Yttria-stabilized cubic zirconia has been studied at 300 K by use of R aman spectroscopy under uniaxial stress along the [001] and [111] dire ctions. The main effects observed are the frequency shifts of the F2g- type Raman band at approximately 610 cm-1 which vary linearly with the applied stress and tend to increase with Y2O3 concentration. Effectiv e deformation potentials are determined for the F2g band. These potent ials are necessary for strain characterization of stabilized cubic zir conia, in buffer or epitaxial film configurations. Polycrystalline ytt ria-stabilized tetragonal zirconia is likewise studied.