KINETICS OF HYDROGEN DESORPTION IN SURFACE-LIMITED THIN-FILM GROWTH OF SIGE ALLOYS

Authors
Citation
Jw. Sharp et G. Eres, KINETICS OF HYDROGEN DESORPTION IN SURFACE-LIMITED THIN-FILM GROWTH OF SIGE ALLOYS, Applied physics letters, 62(22), 1993, pp. 2807-2809
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
22
Year of publication
1993
Pages
2807 - 2809
Database
ISI
SICI code
0003-6951(1993)62:22<2807:KOHDIS>2.0.ZU;2-#
Abstract
The kinetics of hydrogen desorption in surface-limited thin-film growt h of SiGe alloys from binary mixtures of disilane and digermane was in vestigated by surface differential reflectance. The hydrogen desorptio n process from the alloy surface was found to consist of two component s. Both components are thermally activated, but the activation energie s appear to equal neither the hydrogen desorption energy from pure sil icon nor that from pure.germanium surfaces. We suggest that the two co mponents represent Ge- and Si-mediated hydrogen desorption, with the f ormer being more rapid than the latter.