INVESTIGATION OF LATERAL STRAGGLING OF XE IONS IN POTASSIUM TITANYL PHOSPHATE

Authors
WANG KM SHI BR QU BD WANG ZL LIU XD LIU YG ZHAO QT
Citation
Km. Wang et al., INVESTIGATION OF LATERAL STRAGGLING OF XE IONS IN POTASSIUM TITANYL PHOSPHATE, Journal of applied physics, 73(11), 1993, pp. 7222-7224
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
73
Issue
11
Year of publication
1993
Pages
7222 - 7224
Database
ISI
SICI code
0021-8979(1993)73:11<7222:IOLSOX>2.0.ZU;2-G
Abstract
150 keV Xe ions were implanted in potassium titanyl phosphate (KTP) at different angles of 0-degrees, 45-degrees, 60-degrees, and 75-degrees . The lateral straggling of Xe ions in KTP was investigated by normal and oblique incidence Rutherford backscattering of 2.1 MeV He ions. Th e result extracted is compared with the Monte Carlo code TRIm,89. The lateral straggling is seemed to be in a good agreement with TRIM'89 si mulation within experimental error.