L. Chen et al., ON THE EFFECT OF PROCESSING PARAMETERS IN THE CHEMICAL-VAPOR-DEPOSITION OF YBA2CU3O7-DELTA THIN-FILMS ON POLYCRYSTALLINE SILVER, Journal of applied physics, 73(11), 1993, pp. 7563-7570
Results are reported from an investigation of the effects of selected
processing parameters on the morphology and properties of YBa2Cu3O7-de
lta (YBCO) superconducting thin films grown directly on polycrystallin
e silver substrates by chemical-vapor deposition (CVD). These results
were achieved through a set of experimental studies which examined: (i
) recrystallization mechanisms of polycrystalline silver and their eff
ect on the deposition of YBCO thin films; and (ii) CVD processing cond
itions leading to the growth of high-quality YBCO films. The samples w
ere analyzed using dynamic impedance, four-point resistivity probe, x-
ray diffraction, Rutherford backscattering, and scanning electron micr
oscopy. These studies showed that substrate temperature played a criti
cal role not only in the formation of YBCO films, but also in the recr
ystallization of silver substrates, which in turn greatly influenced f
ilm growth. The studies also led to the identification of a two-stage
processing scheme for the growth of YBCO films on silver. The first pr
ocessing stage consisted of a substrate conditioning cycle which invol
ved a 10 min ramping from room temperature to deposition temperature w
here the substrates were held for an additional 10 min in a flow of 70
sccm 02 at a reactor working pressure of 2 Torr. The second processin
g stage involved actual film deposition at 760-800-degrees-C for 3-10
min (depending on desired film thickness) in a mixed flow of 70 sccm O
2 and 210 sccm N2O at a reactor working pressure of 4 Torr. Samples th
us produced were highly oriented along the c axis perpendicular to the
substrate with a zero resistance transition temperature of 87 K and a
critical current density of 2 X 10(4) A/cm2, (77 K, B=0). The films h
ad a thickness of 200-700 nm depending on the length of the growth cyc
le, which corresponded to the growth rates in the range 65-130 nm/min.
A growth mechanism for YBCO on polycrystalline silver, which emphasiz
ed the role of silver recrystallization, was consequently proposed and
discussed.