THICKNESS DEPENDENCE OF ELECTRODYNAMIC PROPERTIES OF TLCABACUO THIN-FILMS

The thickness dependence of electrodynamic properties of T12Ca2Ba2Cu3O x films has been examined after correction for geometrical effects. Th e surface resistance increases for very thin or thick films as is cons istent with the presence of a poorly superconducting layer (phase incl usions or morphology breakdown) as was detected with magnetization mea surements. The temperature dependence of surface resistance has been e xamined at low temperatures and fitted to a multigap model. There was reasonable agreement for moderate thickness films, suggesting why such films have been and will be excellent for applications, while the beh avior of other thicknesses may be dominated by grain boundaries.