COMPARISON OF ELECTRONIC TRANSPORT IN BORON-DOPED HOMOEPITAXIAL, POLYCRYSTALLINE, AND NATURAL SINGLE-CRYSTAL DIAMOND

Citation
Dm. Malta et al., COMPARISON OF ELECTRONIC TRANSPORT IN BORON-DOPED HOMOEPITAXIAL, POLYCRYSTALLINE, AND NATURAL SINGLE-CRYSTAL DIAMOND, Applied physics letters, 62(23), 1993, pp. 2926-2928
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
23
Year of publication
1993
Pages
2926 - 2928
Database
ISI
SICI code
0003-6951(1993)62:23<2926:COETIB>2.0.ZU;2-4
Abstract
Hall-effect and resistivity,measurements were performed on simultaneou sly deposited B-doped homoepitaxial and polycrystalline diamond films, as well as a (100)-oriented type-IIb natural diamond crystal, over a temperature range of 140-600 K. At 298 K, the respective Hall mobiliti es for the homoepitaxial and polycrystalline films were 519 and 33 cm2 /V S, while the active carrier concentrations were both approximately 2 X 10(14) CM-3 . For the natural diamond, a Hall mobility of 564 cm2/ V s and a carrier concentration of 2 X 10(13) CM-3 were measured at ro om temperature. A comparison of the transport behavior of the three sp ecimens indicates that the electronic properties of diamond grown by c hemical vapor deposition are potentially of equal or greater quality t han natural diamond and that the transport properties of polycrystalli ne films are severely degraded by the effects of grain boundaries.