STRUCTURE OF S ON PASSIVATED GAAS (100)

Citation
Zh. Lu et al., STRUCTURE OF S ON PASSIVATED GAAS (100), Applied physics letters, 62(23), 1993, pp. 2932-2934
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
62
Issue
23
Year of publication
1993
Pages
2932 - 2934
Database
ISI
SICI code
0003-6951(1993)62:23<2932:SOSOPG>2.0.ZU;2-5
Abstract
X-ray photoelectron spectroscopy (XPS) and E-polarization-dependent S K-edge x-ray absorption near-edge structure (XANES) are used to charac terize the chemical structure and site location of S on the (NH4)2S-tr eated GaAs (100) surface. XPS studies show that S forms chemical bonds with both Ga and As on surfaces treated only with (NH4)2S. After rece iving a sufficient water rinse, only Ga-S bonds remain on the surface. Photon E polarization-dependent XANES studies show that S is bridge b onded to Ga in the [011] azimuth.