The solid phase reaction of e-beam evaporated Gd thin film and Si subs
trate was investigated by X-ray diffraction and scanning electron micr
oscopy. A description has been developed for the kinetics of the react
ion, which showed sequential, selective growth of two equilibrium phas
es. By strict control of the growth parameters it was possible to reac
h hexagonal GdSi1.7 epitaxy on [111] and orthorhombic GdSi2 epitaxy on
[100] Si substrates. In the lateral growth mode with a Ti step, Gd-Si
showed a rapid and nonuniform reaction.