Ultrathin epitaxial films of beta-FeSi, were grown on Si(001) by room
temperature (RT) deposition of Fe followed by annealing. During the va
rious stages of the growth process the lattice structure, composition
and morphology of the films were investigated by medium-energy ion sca
ttering in conjunction with shadowing and blocking. At RT the deposite
d Fe reacts with the Si(001) substrate and forms a continuous film of
average composition FeSi, or Fe5Si3, depending on the deposited amount
of Fe. After annealing the FeSi film to 670 K, a conversion into beta
-FeSi2 has taken place and the film is no longer continuous. The beta-
FeSi2 films grown are composites of two azimuthal orientations with re
spect to the substrate: the predominant A orientation with beta-FeSi2
[010] parallel-to Si[110] and the B orientation with beta-FeSi2 [010]
parallel-to Si[100].