A curve tracer for the analysis of the electrophysical properties of s
uperconductors and related structures is described. The curve tracer c
an record data in a triangle current scan. The output current range +/
-2 A is determined by the voltage-to-current converter. The control vo
ltage parameters are amplitude +/-7.5 V, integral nonlinearity of the
triangular voltage less-than-or-equal-to 0.03%, trigger spike amplitud
e at the inflection points of the triangular voltage +/-350 mu V, asym
metry between the rise and fall rates of scanning less-than-or-equal-t
o 0.05%. The scan current has good temperature stability with respect
to period and magnitude because only a single reference-voltage source
is used. An arbitrary selected region of a characteristic can be scan
ned both periodically and aperiodically.