LEED CRYSTALLOGRAPHIC INVESTIGATION OF ULTRATHIN FILMS FORMED BY DEPOSITION OF SN ON THE PT(111) SURFACE

Citation
A. Atrei et al., LEED CRYSTALLOGRAPHIC INVESTIGATION OF ULTRATHIN FILMS FORMED BY DEPOSITION OF SN ON THE PT(111) SURFACE, Surface science, 290(3), 1993, pp. 286-294
Citations number
13
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
290
Issue
3
Year of publication
1993
Pages
286 - 294
Database
ISI
SICI code
0039-6028(1993)290:3<286:LCIOUF>2.0.ZU;2-M
Abstract
Deposition of Sn on the Pt(111) surface followed by annealing at 1000 K leads to the formation of ordered phases showing (2 x 2) and (square -root 3 x square-root 3)R30-degrees LEED patterns, depending on the su rface coverage of Sn. Both these phases were studied by LEED dynamical analysis. The best agreement between experimental and calculated I-V curves was obtained by means of models based on the formation of mixed Pt-Sn layers on the surface where Pt and Sn atoms are nearly coplanar with a slight upward buckling of Sn atoms. The structures of these ph ases are similar to those already observed for the Pt3Sn(111) surface.