Fourier transformation of experimental energy-dependent photoelectron
diffraction data has been used to produce an essentially artifact-free
image of a surface alloy. This direct method, based upon the intersec
tion off contour arcs associated with each measurement direction, can
provide vectorial atomic positions with atomic resolution. A rapid dat
a collection mode was introduced. Surface structural sensitivity was c
onfirmed by comparison with multiple-scattering simulations. The previ
ously ambiguous surface geometry of c(2x2)Au/Cu(001) has been determin
ed, with clear, non-model-dependent discrimination of the surface allo
y over the overlayer structure.