PROBE DESIGN EXTENDS ON-WAFER TESTING TO 120 GHZ

Authors
LIU SMJ BOLL GG
Citation
Smj. Liu et Gg. Boll, PROBE DESIGN EXTENDS ON-WAFER TESTING TO 120 GHZ, Microwaves & RF, 32(6), 1993, pp. 104
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic",Telecommunications
Journal title
Microwaves & RF → ACNP
ISSN journal
07452993
Volume
32
Issue
6
Year of publication
1993
Database
ISI
SICI code
0745-2993(1993)32:6<104:PDEOTT>2.0.ZU;2-G