Kr. Li et al., CHARACTERIZATION OF MICROSTRIP LINES NEAR-EDGE OF DIELECTRIC SUBSTRATE WITH RECTANGULAR BOUNDARY DIVISION METHOD, IEICE transactions on electronics, E76C(6), 1993, pp. 977-984
In this paper, the characteristics of microstrip lines near the edge o
f dielectric substrate are analyzed by improving the rectangular bound
ary division method. The numerical results indicate the changes of the
characteristics of a microstrip line when the strip conductor is clos
ely located to the edge. When the distance the dielectric substrate ed
ge to the strip conductor is less than the thickness of dielectric sub
strate, the effects of the edge on the line characteristics are no lon
ger negligible. The numerical results in this paper show high computat
ion accuracy without increasing computation time. Our improvement is e
ffective for the analysis of the microstrip lines both for the narrow
strip conductor and the strip conductor close to the edge. The relativ
e errors between the numerical results and the measured values are les
s than 1.2%.