CHARACTERIZATION OF MICROSTRIP LINES NEAR-EDGE OF DIELECTRIC SUBSTRATE WITH RECTANGULAR BOUNDARY DIVISION METHOD

Citation
Kr. Li et al., CHARACTERIZATION OF MICROSTRIP LINES NEAR-EDGE OF DIELECTRIC SUBSTRATE WITH RECTANGULAR BOUNDARY DIVISION METHOD, IEICE transactions on electronics, E76C(6), 1993, pp. 977-984
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
09168524
Volume
E76C
Issue
6
Year of publication
1993
Pages
977 - 984
Database
ISI
SICI code
0916-8524(1993)E76C:6<977:COMLNO>2.0.ZU;2-T
Abstract
In this paper, the characteristics of microstrip lines near the edge o f dielectric substrate are analyzed by improving the rectangular bound ary division method. The numerical results indicate the changes of the characteristics of a microstrip line when the strip conductor is clos ely located to the edge. When the distance the dielectric substrate ed ge to the strip conductor is less than the thickness of dielectric sub strate, the effects of the edge on the line characteristics are no lon ger negligible. The numerical results in this paper show high computat ion accuracy without increasing computation time. Our improvement is e ffective for the analysis of the microstrip lines both for the narrow strip conductor and the strip conductor close to the edge. The relativ e errors between the numerical results and the measured values are les s than 1.2%.