CHARACTERIZATION OF SURFACE-DEFECTS IN BEDT-TTF SALTS BY SCANNING-TUNNELING-MICROSCOPY

Authors
MAGONOV SN BAR G CANTOW HJ LAUKHIN VN YAGUBSKII EB
Citation
Sn. Magonov et al., CHARACTERIZATION OF SURFACE-DEFECTS IN BEDT-TTF SALTS BY SCANNING-TUNNELING-MICROSCOPY, Synthetic metals, 56(1), 1993, pp. 2222-2227
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Metallurgy & Mining
Journal title
Synthetic metals → ACNP
ISSN journal
03796779
Volume
56
Issue
1
Year of publication
1993
Pages
2222 - 2227
Database
ISI
SICI code
0379-6779(1993)56:1<2222:COSIBS>2.0.ZU;2-V
Abstract
Various defects, registered by scanning tunneling microscopy (STM) on surfaces of single crystals of different bis(ethylenedithio)tetrathiaf ulvalene, BEDT-TTF, salts are characterized. In the large scales (up t o 100X100 mu2) microcracks and terraces, formed by multiple steps of s urface layers are the dominating morphologic features. In the atomic-s cale STM images the observed imperfections are mainly related with vac ancies in the crystallographic ionic lattice. They are formed by misin g cations or anions. Other types of defects such as crystal twinning a nd linear dislocations have been also visualized.