EVALUATION OF INTEGRATED TUNING ELEMENTS WITH SIS DEVICES

Citation
Mmtm. Dierichs et al., EVALUATION OF INTEGRATED TUNING ELEMENTS WITH SIS DEVICES, IEEE transactions on microwave theory and techniques, 41(4), 1993, pp. 605-608
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
41
Issue
4
Year of publication
1993
Pages
605 - 608
Database
ISI
SICI code
0018-9480(1993)41:4<605:EOITEW>2.0.ZU;2-H
Abstract
The resonances of integrated tuning stubs in combination with SIS dete ctors are measured and calculated. The predicted resonances are compar ed with measurements of stubs integrated with Nb/Al2O3/Nb junctions in a log-periodic antenna. Stubs of different lengths have been investig ated on different substrates (on 200 mum thick quartz and on a 7 mum t hick silicon membrane) and the results show a fairly good agreement wi th the model calculations. Quartz substrates showed resonances up to 6 40 GHz, while for silicon membranes stub resonances reach up to as 480 GHz. An observed resonance at 560 GHz is probably a substrate effect from the membrane. The gap frequency for all the samples is 670 GHz an d no resonances are detected above this frequency. Up to the maximum d etected frequency dispersion is found to be negligible.