SCATTERING PARAMETERS MEASUREMENT OF A NONRECIPROCAL COUPLING STRUCTURE

Authors
Citation
P. Kwan et C. Vittoria, SCATTERING PARAMETERS MEASUREMENT OF A NONRECIPROCAL COUPLING STRUCTURE, IEEE transactions on microwave theory and techniques, 41(4), 1993, pp. 652-657
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
41
Issue
4
Year of publication
1993
Pages
652 - 657
Database
ISI
SICI code
0018-9480(1993)41:4<652:SPMOAN>2.0.ZU;2-U
Abstract
A novel ferrite image guide was designed and tested from 26.5 to 40 GH z. The nonreciprocal structure consisted of two dielectric image guide s separated by a ferrite slab. M-type hexagonal ferrite was used with its C-axis oriented parallel and perpendicular to the direction of pro pagation. Electromagnetic scattering S-parameters of the device were m easured for a nonuniform external biasing magnetic field applied paral lel to the C-axis of the ferrite slab. Nonreciprocal effects were obse rved for all cases considered above. Our results implied applications for ferrite devices operating at millimeter wavelength frequencies, su ch as: isolators, filters, modulators, switches, phase shifter etc.