X-RAY TOPOGRAPHIC DEFECTS CONTRAST ON SYNTHETIC QUARTZ

In the present study the linear defects in several synthetic quartz ha ve been surveyed by X-rav topography using Lang method. The grown-in d islocations produced by layers displacement around holes, precipitates or inclusions are discussed. Each growth zone is described with their own defects pattern and some correlations with the external morpholog y of the crystal are stated. There are also pointed out the asymmetry of the defects for every growth zone and the specific role in the grow th mechanism of the s-growth zone. In the final part of the work there are outlined the general and the specific conclusions.